Tomography

Computed tomography (CT)

3D imaging of semiconductor components by discrete laminography

K. J. Batenburg, W J. Palenstijn, and J. Sijbers, "3D imaging of semiconductor components by discrete laminography", Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings, vol. 1601, pp. 168-179, 2014.

Tomographic image reconstruction from continuous projections

J. Cant, W J. Palenstijn, G. Behiels, and J. Sijbers, "Tomographic image reconstruction from continuous projections", The third international conference on image formation in X-ray computed tomography, Salt Lake City, USA, pp. 295-298, 06/2014.

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