Joost Batenburg

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Joost Batenburg's picture

Contact

Prof. Dr.
Joost
Batenburg
Faculty members
Email: 
joost.batenburg@cwi.nl
Address: 

Centrum Wiskunde & Informatica
Scientific Computing group (MAC2.1)
Science Park 123
NL-1098XG Amsterdam, The Netherlands

Phone: 
+31 (0) 205924037
+32 (0) 3 265 2449
Fax: 
+32 (0) 3 265 22 45 (Vision Lab)
+31 (0) 20 592 4199 (CWI)

Personal

Biography: 

Joost Batenburg graduated in Mathematics (2002) and Computer Science (2003) at the University of Leiden, The Netherlands. From 2002 to 2006 he was a Ph.D. student at the University of Leiden and CWI in Amsterdam. He obtained his Ph.D. in Mathematics in 2006 with the thesis "Network Flow Algorithms for Discrete Tomography".

He then moved to the Vision Lab at the University of Antwerp, where he worked as an FWO Postdoctoral Fellow (2006-2010) and from March 2010 as a part-time professor for 1 day per week. With Jan Sijbers, he leads the ASTRA group, which focuses on developing new algorithms and techniques for tomographic reconstruction at all scales.

Since 1 March 2010, he is a scientific staff member at the Centrum Wiskunde & Informatica
in Amsterdam, where he performs research in the field of computational imaging.

Research

My research interests include:

  • Discrete tomography and other subjects in tomographic image reconstruction
  • Electron tomography for imaging at the nanometer scale, downto atomic resolution
  • Applications of tomography in materials science and medical imaging
  • Combinatorial optimization, modern optimization heuristics such as
    evolutionary algorithms
  • GPU computing for large-scale scientific computing
  • Image processing and computer vision
  • Inverse problems
Key publications: 
K J. Batenburg, S. Bals, J. Sijbers, C. Kubel, P. A. Midgley, J. C. Hernandez, U. Kaiser, E. R. Encina, E. A. Coronado, and G. Van Tendeloo, "3D imaging of nanomaterials by discrete tomography", Ultramicroscopy, vol. 109, pp. 730-740, 2009.
K. J. Batenburg, and J. Sijbers, "Adaptive thresholding of tomograms by projection distance minimization", Pattern Recognition, vol. 42, no. 10, pp. 2297-2305, April, 2009. Download full paper (1.05 MB)
K. J. Batenburg, and J. Sijbers, "Optimal Threshold Selection for Tomogram Segmentation by Projection Distance Minimization", IEEE Transactions on Medical Imaging, vol. 28, no. 5, pp. 676-686, June, 2009. Download full paper (2.51 MB)