Comparison of methods for online inspection of apple internal quality

TitleComparison of methods for online inspection of apple internal quality
Publication TypeConference Paper
Year of Publication2017
AuthorsM. Van Dael, P. Verboven, L. Van Hoorebeke, J. Sijbers, and B. Nicolai
Conference Name7th Conference on Industrial Computed Tomography
Conference LocationLeuven, Belgium
Research area: