Fast inline inspection by neural network based filtered backprojection: Application to apple inspection

TitleFast inline inspection by neural network based filtered backprojection: Application to apple inspection
Publication TypeJournal Article
Year of Publication2016
AuthorsE. Janssens, L. F. Alves Pereira, J. De Beenhouwer, I R. Tsang, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers
JournalCase Studies in Nondestructive Testing and Evaluation
Volume6
Pagination14–20
DOI10.1016/j.csndt.2016.03.003
Research area: