Model-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography

TitleModel-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography
Publication TypeThesis
Year of Publication2004
AuthorsE. Van de Casteele
AdvisorD. Van Dyck, and E. Raman
UniversityUniversity of Antwerp
CityAntwerp
Thesis TypePhD thesis