Joost Batenburg

Name:	K. Joost Batenburg
Postal Address:	Vision Lab, Department of Physics
	University of Antwerp (CDE)
	Universiteitsplein 1 (N.1.11)
	B-2610 Wilrijk, Belgium
Tel:	+32 (0) 3 265 24 49
Fax:	+32 (0) 3 265 22 45
Email:	joost.batenburg@ua.ac.be

Brief CV

Research interests My research interests include: Discrete tomography and other subjects in tomographic image reconstruction Applications of discrete tomography in materials science and medical imaging Combinatorial optimization, modern optimization heuristics such as evolutionary algorithms Image processing and computer vision Inverse problems Interesting links I wrote several computer programs for the project "Escher and the Droste effect" of Prof. H.W. Lenstra, which was covered in the New York Times, Notices of the AMS and SIAM News. One of my main research areas is Discrete Tomography, which deals with the reconstruction of images from their projections. Discrete tomography problems have much in common with Japanese Puzzles (also known as Nonograms), which are sold in puzzle books all over the world. With my colleague Walter Kosters, I have developed several methods for solving such puzzles. We are still aspiring to develop the ultimate Japanese Puzzle solver... The ASTRA research group recently launched a website around our desktop supercomputer called FASTRA (also available in Dutch). FASTRA contains four dual-GPU graphics cards; it outperforms a large cluster for our applications.

Publications

Theses

• K.J. Batenburg, "Network flow algorithms for discrete tomography", Ph.D. thesis, University of Leiden, The Netherlands (2006).
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• K.J. Batenburg, "An evolutionary algorithm for discrete tomography", M.Sc. thesis in Computer Science, University of Leiden, The Netherlands (2003).
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• K.J. Batenburg, "Analysis and optimization of an algorithm for discrete tomography", M.Sc. thesis in Mathematics, University of Leiden, The Netherlands (2002).
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Journal papers

• S. Turner, S.M.F. Tavernier, G. Huyberechts, E. Biermans, S. Bals, K.J. Batenburg and G. Van Tendeloo, "Assisted spray pyrolysis production and characterisation of ZnO nanoparticles with narrow size distribution", J. Nanoparticle Research, to appear, already available online.
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• K.J. Batenburg and J. Sijbers, "Adaptive thresholding of tomograms by Projection Distance Minimization", Pattern Recognition, 42(10), 2297-2305 (2009).
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• K.J. Batenburg and W.A. Kosters, "Solving Nonograms by Combining Relaxations", Pattern Recognition, 42(8), 1672-1683 (2009).
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• K.J. Batenburg and J. Sijbers, "Optimal Threshold Selection for Tomogram Segmentation by Projection Distance Minimization", IEEE Trans. Medical Imaging, 28(5), 676-686 (2009).
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• G. Van Gompel, M. Defrise and K.J. Batenburg, "Reconstruction of a uniform star object from interior x-ray data: uniqueness, stability and algorithm", Inverse Problems, 25(6), 065010 (19pp) (2009).
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• L.A. Montoro, M.S. Leite, D. Biggemann, F.G. Peternella, K.J. Batenburg, G. Medeiros-Ribeiro, and A.J. Ramirez, "Revealing quantitative 3D chemical arrangement on Ge-Si nanostructures", Journal of Physical Chemistry C, 113(21), 9018-9022 (2009).
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• S. Bals, K.J. Batenburg, D. Liang, O. Lebedev, G. Van Tendeloo, A. Aerts, J.A. Martens, and C.E.A. Kirschhock, "Quantitative three-dimensional modeling of Zeotile through discrete electron tomography", Journal of the American Chemical Society, 131(13), 4769-4773 (2009).
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• K.J. Batenburg, S. Bals, J. Sijbers, C. Kuebel, P.A. Midgley, J.C. Hernandez, U. Kaiser, E.R. Encina, E.A. Coronado and G. Van Tendeloo, "3D imaging of nanomaterials by discrete tomography", Ultramicroscopy, 109(6), 730-740 (2009).
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• K.J. Batenburg and J. Sijbers, "Generic iterative subset algorithms for discrete tomography", Discrete Applied Mathematics, 157(3), 438-451 (2009.
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• K.J. Batenburg, "A network flow algorithm for reconstructing binary images from continuous X-rays", J. Math. Im. Vision, 30(3), 231-248 (2008).
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• J.R. Jinschek, K.J. Batenburg, H.A. Calderon, R. Kilaas, V. Radmilovic and C. Kisielowski "3D-reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography", Ultramicroscopy, 108(6), 589-604 (2008).
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• S. Bals, K.J. Batenburg, J. Verbeeck, J. Sijbers and G. Van Tendeloo "Quantitative 3D reconstruction of catalyst particles for bamboo-like carbon-nanotubes", Nano Letters, 7(12), 3669-3674 (2007).
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• K.J. Batenburg, "A network flow algorithm for reconstructing binary images from discrete X-rays", J. Math. Im. Vision, 27(2), 175-191 (2007).
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• K.J. Batenburg, "An evolutionary algorithm for discrete tomography", Discrete Appl. Math., 151, 36-54 (2005).
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Book Chapters and Lecture Notes

• K.J. Batenburg and J. Sijbers, "Selection of local thresholds for tomogram segmentation by projection distance minimization", to appear in Lecture Notes in Computer Science (2008).
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• K.J. Batenburg and W.A. Kosters, "A reasoning framework for solving nonograms", to appear in Lecture Notes in Computer Science, 4958, 372-383, Springer (2008).
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• K.J. Batenburg, "Network flow algorithms for discrete tomography", chapter in the book: G.T. Herman and A. Kuba, eds., Advances in discrete tomography and its applications, 175-205, Birkhäuser, Boston (2007).
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• K.J. Batenburg and J. Sijbers, "Optimal threshold selection for tomogram segmentation by reprojection of the reconstructed image", Lecture Notes in Computer Science, 4673, 563-570, Springer (2007).
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• K.J. Batenburg, "A network flow algorithm for binary image reconstruction from few projections", Lecture Notes in Computer Science, 4245, 86-97, Springer (2006).
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• K.J. Batenburg and W.A. Kosters, "A neural network approach to real-time discrete tomography", Lecture Notes in Computer Science, 4040, 389-403, Springer (2006).
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• K.J. Batenburg, "A new algorithm for 3D binary tomography", Electron. Notes Discrete Math., 20, 247-261 (2005).
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• K.J. Batenburg and W.J. Palenstijn, "On the reconstruction of crystals through discrete tomography", Lecture Notes in Computer Science, 3322, 23-37, Springer (2004).
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• K.J. Batenburg, "Analysis and optimization of an algorithm for discrete tomography", Electron. Notes Discrete Math., 12 (2003).
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Refereed conference proceedings (full paper)

• K.J. Batenburg and J. Sijbers, "DART: a fast heuristic algebraic reconstruction algorithm for discrete tomography", Proc. of ICIP 2007 (IEEE Conference on Image Processing), IV 133-136.
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• K.J. Batenburg and J. Sijbers, "Automatic multiple threshold scheme for segmentation of tomograms", Proc. of SPIE Medical Imaging 2007, Proc. of SPIE, 6512 (2007).
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• K.J. Batenburg, "A learning classifier approach to tomography", Proc. of ECAI 2006 (European Conference on Artificial Intelligence), Riva del Garda, Italy, Frontiers in Artificial Intelligence and Applications, 141, 655-659, IOS Press (2006).
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• K.J. Batenburg and J. Sijbers, "Discrete tomography from micro-CT data: application to the mouse trabecular bone structure", Proc. of SPIE Medical Imaging 2006, Proc. of SPIE, 6142, 1325-1335 (2006).
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• K.J. Batenburg and J. Sijbers, "Trabecular bone reconstruction from micro-CT data using discrete tomography", Proc. of SPS DARTS 2006 (the 2006 The second annual IEEE BENELUX/DSP Valley Signal Processing Symposium), 65-69 (2006).
  


• K.J. Batenburg and W.A. Kosters, "Neural networks for discrete tomography", Proc. of BNAIC 2005 (Belgian-Dutch Artificial Intelligence Conference), 21-27 (2005).
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• J.R. Jinschek, H.A. Calderon, K.J. Batenburg, V. Radmilovic and C. Kisielowski, "Discrete tomography of Ga and InGa particles from HREM image simulation and exit wave reconstruction", MRS Proc. (Materials Research Society) 839, 4.5.1-4.5.6 (2004).
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• K.J. Batenburg and W.A. Kosters, "A discrete tomography approach to Japanese puzzles", Proc. of BNAIC 2004 (Belgian-Dutch Artificial Intelligence Conference), 243-250 (2004).
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• K.J. Batenburg and W.J. Palenstijn, "A new exam timetabling algorithm", Proc. of BNAIC 2003 (Belgian-Dutch Artificial Intelligence Conference), 19-26 (2003).
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Conference abstracts

• K.J. Batenburg, U. Kaiser and C. Kübel, "3D imaging of nanomaterials by discrete tomography", Proc. of Microscopy & Microanalysis 2006, Microscopy & Microanalysis, 12, 1568-1569 (2006).
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• K.J. Batenburg, J.R. Jinschek, H.A. Calderon and C. Kisielowski, "Incorporating prior knowledge for atomic resolution discrete tomography", Proc. of Microscopy & Microanalysis 2006, Microscopy & Microanalysis, 12, 1572-1573 (2006).
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• J.R. Jinschek, K.J. Batenburg, H.A. Calderon, R. Kilaas, V. Radmilovic and C. Kisielowski, "Atomic resolution electron tomography based on discrete mathematics", Proc. of Microscopy & Microanalysis 2006, Microscopy & Microanalysis, 12, 1566-1567 (2006).
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• K.J. Batenburg, J.R. Jinschek and C. Kisielowski, "Atomic resolution electron tomography on a discrete grid: atom count errors", Proc. of Microscopy & Microanalysis 2005, Microscopy & Microanalysis, 11, 2120-2121 (2005).
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• J.R. Jinschek, K.J. Batenburg, H.A. Calderon, D. van Dyck, F.-R. Chen and C. Kisielowski, "Prospects for bright field and dark field electron tomography on a discrete grid", Proc. of Microscopy & Microanalysis 2004, Microscopy & Microanalysis, 10, 44-45 (2004).
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